Scanning Transmission Electron Microscopy Of Nanomaterials: Basics Of Imaging And Analysis (Kobo eBook)

Scanning Transmission Electron Microscopy Of Nanomaterials: Basics Of Imaging And Analysis Cover Image
$62.00
Available Now

Description


The basics, present status and future prospects of high-resolution scanning transmission electron microscopy (STEM) are described in the form of a textbook for advanced undergraduates and graduate students. This volume covers recent achievements in the field of STEM obtained with advanced technologies such as spherical aberration correction, monochromator, high-sensitivity electron energy loss spectroscopy and the software of image mapping. The future prospects chapter also deals with z-slice imaging and confocal STEM for 3D analysis of nanostructured materials.

Product Details
ISBN-13: 9781783264711
Publisher: Imperial College Press
Publication Date: August 21st, 2014
Language:

Indie Next List

This feature require that you enable JavaScript in your browser.

Indie Bestsellers

This feature require that you enable JavaScript in your browser.